DEVELOPMENTS IN METROLOGY IN SUPPORT OF NANOTECHNOLOGY

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dc.creatorA. B. Abubakirov
dc.creatorSh. B. Kuatova
dc.creatorU. A. Eshniyazova
dc.date2021-06-12
dc.date.accessioned2023-08-21T07:41:31Z
dc.date.available2023-08-21T07:41:31Z
dc.descriptionNanotechnology emerges out of fundamental science through capability for accurate, repeatable and reproducible measurements on the nanoscale which allows scientists and engineers to accumulate knowledge. Understanding the measurement science is the first step towards development of new ideas. This paper describes some research initiatives which underpin the development of nanotechnology. Programs underway at the National Research Council of Canada.Thia include development of metrological scanning-probe microscope instrumentation for dimensional calibration, materials characterization, development of artefacts designed specifically for dimensional calibration, investigation of metrology for application to soft materials and investigation of intrinsic length standards for realization of the SI metre at the nanoscale.en-US
dc.formatapplication/pdf
dc.identifierhttps://openaccessjournals.eu/index.php/ijiaet/article/view/19
dc.identifier.urihttp://dspace.umsida.ac.id/handle/123456789/13601
dc.languageeng
dc.publisherOpen Access Journalsen-US
dc.relationhttps://openaccessjournals.eu/index.php/ijiaet/article/view/19/18
dc.rightsCopyright (c) 2021 International Journal of Innovative Analyses and Emerging Technologyen-US
dc.sourceInternational Journal of Innovative Analyses and Emerging Technology; Vol. 1 No. 1 (2021): International Journal of Innovative Analyses and Emerging Technology (2792-4025); 20-21en-US
dc.source2792-4025
dc.subjectNanotechnologyen-US
dc.subjectmeasurementen-US
dc.subjectbasisen-US
dc.subjectproceduresen-US
dc.subjecttechnicalen-US
dc.titleDEVELOPMENTS IN METROLOGY IN SUPPORT OF NANOTECHNOLOGYen-US
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typePeer-reviewed Articleen-US
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